Scan is a structured test approach in which the overall function of an integrated circuit (IC) is broken into smaller structures and tested individually. Every state element (D flip-flop or latch) is ...
The verification component of SystemVerilog has dominated the rapid adoption of the language. The new verification syntax in the language allows for dramatic productivity gains in the verification ...
With each turn of Moore's Law, designers at every phase in the development process are challenged with new levels of complexity. Chip designers must not only get the integrated circuit (IC) logic, ...
What is the Conducted EMI measurement? Using FFT-based measuring receivers for CISPR 32. Combining debugging and pre-compliance modes in test equipment. EMC compliance testing of a manufacturer’s ...
In increasingly complex SoC designs, many of which contain multiple cores and multiple modes, determining best practices for testing and debugging is a moving target. Jason Andrews, architect at ...
“Volume diagnosis and debug play a key role in identifying systematic test failures caused by manufacturing defectivity, design marginalities, and test overkill. However, diagnosis tools often suffer ...
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