Scan is a structured test approach in which the overall function of an integrated circuit (IC) is broken into smaller structures and tested individually. Every state element (D flip-flop or latch) is ...
The verification component of SystemVerilog has dominated the rapid adoption of the language. The new verification syntax in the language allows for dramatic productivity gains in the verification ...
In increasingly complex SoC designs, many of which contain multiple cores and multiple modes, determining best practices for testing and debugging is a moving target. Jason Andrews, architect at ...
“Volume diagnosis and debug play a key role in identifying systematic test failures caused by manufacturing defectivity, design marginalities, and test overkill. However, diagnosis tools often suffer ...
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